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Re: X-Rite iSis and dual measurements



Klaus Karcher wrote:
AFAIK this mode estimates the amount of optical brighteners in the substrate by the size of the hunch in the blue region and the gap on the short wave end of the spectrum (I'm sure Graeme can explain it much better than me). This estimation seems to work satisfactorily in common cases, but why estimating if you can measure it? And what about optical brighteners in inks? They can't be estimated this way.

Sorry, No, I've no real Idea what Profile Maker does with FWA compensation. I can only speak about the approach I used with some success.

Graeme Gill.

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References: 
 >Re: X-Rite iSis and dual measurements (From: Andrew Rodney <email@hidden>)
 >Re: X-Rite iSis and dual measurements (From: Klaus Karcher <email@hidden>)



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