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Re: X-Rite iSis and dual measurements




On Jul 30, 2007, at 08:59 , Graeme Gill wrote:

Dan Reid wrote:

<snipped>

Also interesting to note GretagMacbeth devices always measured
in 10nm increments while X-Rite choose 20nm increments for their legacy
devices.

Not correct. Most X-Rite devices (ie. DTP41 etc.) return measurements at 10nm spacing.

Many of the older X-Rite instruments use 20 nm filters for the measurement, the results of which are then interpolated to 10 nm. The DTP-41 uses 20 nm sampling.


The reason X-Rite instruments could get away with this 20 nm sampling is that reflective spectra for many of their target applications do not have sharp transitions that would be missed by the wider sampling. These 20 nm instruments were usually not used for monitor measurements where the phosphors might have really sharp transitions (e.g. the red CRT phosphor).

Robin Myers
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References: 
 >Re: X-Rite iSis and dual measurements (From: Dan Reid <email@hidden>)
 >Re: X-Rite iSis and dual measurements (From: Graeme Gill <email@hidden>)



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