Re: X-Rite iSis and dual measurements

• Subject: Re: X-Rite iSis and dual measurements
• From: Robin Myers <email@hidden>
• Date: Mon, 30 Jul 2007 17:37:51 -0700
• Delivered-to: email@hidden
• Delivered-to: email@hidden

Marco,

As I recall, the sampling interval is 3.5 nm.

Robin Myers

On Jul 30, 2007, at 09:49 , Marco Ugolini wrote:

In a message dated 7/30/07 9:36 AM, Robin Myers wrote:

Many of the older X-Rite instruments use 20 nm filters for the
measurement, the results of which are then interpolated to 10 nm. The
DTP-41 uses 20 nm sampling.

Hi Robin.

Do you happen to know what actual measurement intervals (not interpolated)
are used by the EyeOne Pro Rev D?

Marco Ugolini

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