• Contrary to previously reported results, we found very little
correlation between failure rates and either elevated temperature or
activity levels.
• Some SMART parameters (scan errors, reallocation counts, offline
reallocation counts, and probational counts) have a large impact on
failure probability.
• Given the lack of occurrence of predictive SMART signals on a large
fraction of failed drives, it is unlikely that an accurate predictive
failure model can be built based on these signals alone.
Dave Schroeder | University of Wisconsin - Madison
Email: email@hidden | Division of Information Technology
Web: das.doit.wisc.edu | B263 Computer Science and Statistics
Mobile: +1 608 444-5672 | 1210 West Dayton Street
Office: +1 608 265-4737 | Madison, Wisconsin 53706-1685
_______________________________________________
Do not post admin requests to the list. They will be ignored.
Macos-x-server mailing list (email@hidden)
Help/Unsubscribe/Update your Subscription:
http://lists.apple.com/mailman/options/macos-x-server/email@hidden
This email sent to email@hidden
