17 Dec
2014
17 Dec
'14
4:27 p.m.
On Dec 17, 2014, at 9:23 AM, Jeremy Hansen <jeremy.hansen@rrd.com> wrote:
Anyone aware of an application which will facilitate reflective measurement of a sample, using an Eye-One Pro (ideally, any rev, A-E), and return device values for a chosen ICC profile? It would need to run on the latest Mac OS.
If you're not afraid of the command line, Argyll does all that and more. b&