Re: X-Rite iSis and dual measurements
Re: X-Rite iSis and dual measurements
- Subject: Re: X-Rite iSis and dual measurements
- From: Robin Myers <email@hidden>
- Date: Mon, 30 Jul 2007 09:36:03 -0700
On Jul 30, 2007, at 08:59 , Graeme Gill wrote:
Dan Reid wrote:
<snipped>
Also interesting to note GretagMacbeth devices always measured
in 10nm increments while X-Rite choose 20nm increments for their
legacy
devices.
Not correct. Most X-Rite devices (ie. DTP41 etc.) return measurements
at 10nm spacing.
Many of the older X-Rite instruments use 20 nm filters for the
measurement, the results of which are then interpolated to 10 nm. The
DTP-41 uses 20 nm sampling.
The reason X-Rite instruments could get away with this 20 nm sampling
is that reflective spectra for many of their target applications do
not have sharp transitions that would be missed by the wider
sampling. These 20 nm instruments were usually not used for monitor
measurements where the phosphors might have really sharp transitions
(e.g. the red CRT phosphor).
Robin Myers
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