Re: Rips
Re: Rips
- Subject: Re: Rips
- From: Henrik Holmegaard <email@hidden>
- Date: Fri, 20 Sep 2002 11:00:24 +0200
Graeme Gill <email@hidden> wrote:
>
Our high
>
quality profiles use about 3000+ test patches, and hence cost
>
to print, and cost time and effort to read and process. By
>
comparison, printing and reading a few step wedges is cheap
>
and fast. A calibration system that is too difficult to use
>
is nearly as useless as no calibration system as all, because
>
users simply won't use it.
The ability to work effectively with large test charts for precision
proofing devices has in part to do with the measuring instrument, or more
simply put with the difference between non-scanning and scanning
instruments, and between different types of instrument scanning systems.
IMHO for proofing devices characterized through extended test charts such as
the ECI 2002, x-y chart scanning is the step from doable to done.
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