Re: arbitrary profiling targets
Re: arbitrary profiling targets
- Subject: Re: arbitrary profiling targets
- From: Marco Ugolini <email@hidden>
- Date: Fri, 19 May 2006 21:44:14 -0700
In a message dated 5/19/06 9:36 PM, Roberto Michelena wrote:
>> Pardon my ignorance, but what do you mean by "arbitrary" targets and
>> measurement files? do they generate "arbitrary" profiles? And what would
>> those be good for? What is the point of it?
>
> Marco,
>
> Some profiling applications only accept the targets they "know";
> usually a bunch of standard targets (IT8.7/3, ECI2002, etc) and some
> of their own make.
> But there are others that can accept a target previously unknown to
> them, as long as they get the target definition file ("reference" in
> ProfileMaker's argot, or more properly said "device values").
> So you can hack up a program that spits CMYK combinations as it suits
> you, as many as you want, and make a profiling target from there.
> That's how some people build profiles from measurements of over 10,000
> points, instead of your typical 1000-2000 measurement points.
> That's an "arbitrary target": one that does not necesarily conform to
> a pre-set rule or group.
> The profiles are of course anything but arbitrary, as long as the
> measurements come from a valid device :)
Ah, those are what I have been calling "custom targets" so far.
I am familiar with those and how they can be created using MeasureTool, for
example.
Time to upgrade my terminology, then... :-)
Thank you for the clarification.
Best regards.
--------------
Marco Ugolini
Mill Valley, CA
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