Re: SWOP Reference Profile
Re: SWOP Reference Profile
- Subject: Re: SWOP Reference Profile
- From: Dan Caldwell <email@hidden>
- Date: Mon, 4 Sep 2006 11:35:49 -0700
| Gentlemen,
One big factor in the decision was the results of the IPA proofing roundup where 20+ systems within a measured tolerance looked incredibly close to the sheet that the data set was measured from. The technical committee is made up of a good cross section of end users, color consultants, and system manufacturers. They are working very hard to address all issues. Butt your concern is understood as this is still the printing industry so of course we will have some issues however we all feel this is a huge step in the right direction
Dan
On Sep 4, 2006, at 10:30 AM, Ray Maxwell wrote: Hi Dan,
HOORAY!!! WELL IT'S ABOUT TIME!!! WAY TO GO, SWOP TECHNICAL COMMITTEE!!!
Finally, an attempt to make a printing standard objective. I am delighted to hear this.
I am retired now and no longer work in the field. ( I still do a few talks and some consulting) However, I have always dreamed of a day when the printing industry would move to modern manufacturing methods. I spent the last years of my career advocating these changes.
To Roger...I realize there are problems. However, given viewer metameterism, I have never understood how asking three people to judge when a match is "close enough" is better than using objective measurements. Viewer metameterism can be as large as delta E 5.
I look forward to seeing the results of this effort.
Ray Maxwell
Dan Caldwell wrote:
All that being said SWOP is now moving from a perceptual certification to a measured certification program and all systems will be re-certified under this new system over the next six months. A new ADS for the measured will be posted for each system. You must remember SWOP is a 20+ year old organization that pre dates all digital imaging. The perceptual method using industry experts was all that was available in the early days. Now since virtually every proofing system uses or relates to ICC the systems can be measured against the characterization data set from a print condition.
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Dan Caldwell
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