Re: X-Rite iSis and dual measurements
Re: X-Rite iSis and dual measurements
- Subject: Re: X-Rite iSis and dual measurements
- From: Todd Shirley <email@hidden>
- Date: Mon, 23 Jul 2007 07:53:57 -0400
Hi
I know I'm coming to this thread a little late (I was on vacation),
but back in May I had some official correspondence with Bruce Wright
at Xrite on how the ISIS operates. He said:
"In ProfileMaker's MeasureTool when the instrument is in "UV Cut"
mode, it will take 1 measurement. When the instrument is in "UV Cut +
No" mode, it will take 2 measurements, and use the difference between
them to compute the effects of any optical brighteners in the paper
stock."
So according to Bruce, the DEVICE is doing some sort of computation.
Seems odd. Just thought I'd mention it.
-Todd Shirley
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