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Re: X-Rite iSis and dual measurements

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Re: X-Rite iSis and dual measurements

Subject: Re: X-Rite iSis and dual measurements
From: Terry Wyse <email@hidden>
Date: Mon, 30 Jul 2007 19:03:04 +0100

3.5 nanometers.

Regards,
Terry Wyse

Sent from Terry's iPhone

On Jul 30, 2007, at 5:49 PM, Marco Ugolini <email@hidden> wrote:

In a message dated 7/30/07 9:36 AM, Robin Myers wrote:

Many of the older X-Rite instruments use 20 nm filters for the
measurement, the results of which are then interpolated to 10 nm. The
DTP-41 uses 20 nm sampling.

Hi Robin.

Do you happen to know what actual measurement intervals (not interpolated) are used by the EyeOne Pro Rev D?

Marco Ugolini


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Re: X-Rite iSis and dual measurements
From: Marco Ugolini <email@hidden>


References:  
  >Re: X-Rite iSis and dual measurements (From: Marco Ugolini <email@hidden>)




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