Re: Device values from i1 swatch measurements
Re: Device values from i1 swatch measurements
- Subject: Re: Device values from i1 swatch measurements
- From: Ben Goren <email@hidden>
- Date: Wed, 17 Dec 2014 09:27:37 -0700
On Dec 17, 2014, at 9:23 AM, Jeremy Hansen <email@hidden> wrote:
>> Anyone aware of an application which will facilitate reflective
>> measurement of a sample, using an Eye-One Pro (ideally, any rev, A-E), and
>> return device values for a chosen ICC profile? It would need to run on the
>> latest Mac OS.
If you're not afraid of the command line, Argyll does all that and more.
b&
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