• Open Menu Close Menu
  • Apple
  • Shopping Bag
  • Apple
  • Mac
  • iPad
  • iPhone
  • Watch
  • TV
  • Music
  • Support
  • Search apple.com
  • Shopping Bag

Lists

Open Menu Close Menu
  • Terms and Conditions
  • Lists hosted on this site
  • Email the Postmaster
  • Tips for posting to public mailing lists
Re: Eye-One Scan Ruler
[Date Prev][Date Next][Thread Prev][Thread Next][Date Index][Thread Index]

Re: Eye-One Scan Ruler


  • Subject: Re: Eye-One Scan Ruler
  • From: Henrik Holmegaard <email@hidden>
  • Date: Sat, 11 Aug 2001 07:29:38 +0200

Randy Wright wrote:

If anyone has mastered the art of measuring strips of
patches with the Gretag Macbeth Eye-One and its scan
guide, I would appreciate some tips. I have yet to be
able to do 3 valid scan measurements in a row. The
typical message is "too many errors" or "border
patches not detected properly". With my usual success
rate, it is faster to measure in patch mode.

I thought this one might come up :

a. if you are measuring the Eye-One scan target, Eye-One CMYK target or Eye-One RGB target, you can run the Eye-One Pro from top to bottom or bottom to top of the guide, and the autoscanning is very fast and very reliable, but

b. if you are measuring a non-Eye-One target, say any of the other targets that ship with ProfileMaker Pro, you need to measure in patch mode and not strip mode ... if you try to measure in strip mode there is an error message.

The patch-to-patch sequence of a test chart needs to be optimized for maximum dE in order that the Eye-One Pro can sense the difference when scanning.

There is a note on this in ProfileMaker Pro 3.1.5 which ships with both the new Eye-One targets and the targets ProfileMaker has for X-Rite and GretagMacbeth instruments.


  • Follow-Ups:
    • Re: Eye-One Scan Ruler
      • From: Steve Upton <email@hidden>
  • Prev by Date: Re: Grabbing and scaling for legibility
  • Next by Date: Re: ICC in PDF / iQueue
  • Previous by thread: Re: Eye-One Scan Ruler
  • Next by thread: Re: Eye-One Scan Ruler
  • Index(es):
    • Date
    • Thread