Re: Pre-Linearization or Iterative Profiling (WAS Re: Printer profile mis-shape?)
Re: Pre-Linearization or Iterative Profiling (WAS Re: Printer profile mis-shape?)
- Subject: Re: Pre-Linearization or Iterative Profiling (WAS Re: Printer profile mis-shape?)
- From: Graeme Gill <email@hidden>
- Date: Tue, 29 Aug 2006 12:22:41 +1000
More uniform sampling provides a data set for the profiling engine that is
more regular, and from which the profile can construct a model (profile)
that exhibits better detail and balance.
Actually, a number of experiments I conducted a while ago,
hinted that this idea, while appealing, doesn't actually
work that way in practice.
The best explanation for why this may not work as expected,
is that the aim of profiling is to construct a device value
to CIE value mapping. Creating a uniform test chart in the
CIE values, causes the sample spacing of the device values to
be non-uniform, meaning that the sampling density of device
values is compromised.
There are approaches to creating test charts that give the
best possibly accuracy profiles as a result, but the optimal
approach is probably not as simple as making the measured
values uniformly distributed.
I wrote some of what I did for the color imaging conference:
<http://www.imaging.org/store/epub.cfm?abstrid=32145>
Graeme Gill.
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