Re: X-Rite iSis and dual measurements
Re: X-Rite iSis and dual measurements
- Subject: Re: X-Rite iSis and dual measurements
- From: Beisch Clemens <email@hidden>
- Date: Sat, 21 Jul 2007 19:52:35 +0200
Am 21.07.2007 um 19:38 schrieb Andrew Rodney:
Are you saying that I have to use MeasureTool and select UV Cut and
No to
get both?
Yes I think so.
The measure option in PM is just for "direct profiling", while MT is
for capturing measurements, comparing and so on.
So for me it makes sense to have the option for both sets at one time
in MT only.
But again - I'm only guessing.
Best regards,
Clemens Beisch
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