Re: X-Rite iSis and dual measurements
Re: X-Rite iSis and dual measurements
- Subject: Re: X-Rite iSis and dual measurements
- From: Klaus Karcher <email@hidden>
- Date: Sat, 21 Jul 2007 20:15:42 +0200
Beisch Clemens wrote:
So for me it makes sense to have the option for both sets at one time in
MT only.
Don't you think that a smart profiler could benefit from both data sets
by adjusting the data to the UV amount of the output condition? Is PM
not yet smart enough to do so?
Klaus
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