Re: X-Rite iSis and dual measurements
Re: X-Rite iSis and dual measurements
- Subject: Re: X-Rite iSis and dual measurements
- From: Andrew Rodney <email@hidden>
- Date: Sat, 21 Jul 2007 14:03:59 -0600
- Thread-topic: X-Rite iSis and dual measurements
On 7/21/07 1:02 PM, "Klaus Karcher" wrote:
> AFAIK this mode estimates the amount of optical brighteners in the
> substrate by the size of the hunch in the blue region and the gap on the
> short wave end of the spectrum (I'm sure Graeme can explain it much
> better than me). This estimation seems to work satisfactorily in common
> cases, but why estimating if you can measure it?
I'm aware of what they've done and would agree, based on literally thousands
of profiles built with the package, it does a very good job. And yes, I'd
agree that it might be more useful to actually measure this which I suspect
they wish to do (or may be doing now).
Andrew Rodney
http://www.digitaldog.net/
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