Re: X-Rite iSis and dual measurements
Re: X-Rite iSis and dual measurements
- Subject: Re: X-Rite iSis and dual measurements
- From: Marco Ugolini <email@hidden>
- Date: Mon, 30 Jul 2007 20:49:24 -0700
- Thread-topic: X-Rite iSis and dual measurements
In a message dated 7/30/07 7:12 PM, dannyp wrote:
> Marco,
>
> Download the i1 System Brochure brochure from this page:
>
> http://www.gretagmacbeth.com/index/products/products_color-mgmt-spec/products_
> cm-for-creatives/products_i1proof/products_eye_one_proof_docs.htm
>
> This pdf indicates a sampling interval of 3.5 nm.
Thank you, Danny.
The sampling intervals are 3.5nm, but the spectral reporting is at 10nm.
Pity that one seems not to have a choice of 5nm intervals in the reporting.
But maybe it's not so important for print profiles. It would help with
monitor profiles, though, given the known "spikiness" in the spectral
energies of fluorescent backlights.
Marco Ugolini
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