Re: X-Rite iSis and dual measurements
Re: X-Rite iSis and dual measurements
- Subject: Re: X-Rite iSis and dual measurements
- From: Graeme Gill <email@hidden>
- Date: Tue, 31 Jul 2007 15:26:08 +1000
Marco Ugolini wrote:
Pity that one seems not to have a choice of 5nm intervals in the reporting.
But maybe it's not so important for print profiles. It would help with
monitor profiles, though, given the known "spikiness" in the spectral
energies of fluorescent backlights.
Actually, using my driver in Argyll you can select 3.3nm reporting.
It does make a difference to the appearance of spikes from CRTs.
Graeme Gill
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